Issued Patents 2020
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10840056 | Multi-column scanning electron microscopy system | Aron Welk, Tomas Plettner, John Gerling, Mehran Nasser Ghodsi | 2020-11-17 |
| 10777377 | Multi-column spacing for photomask and reticle inspection and wafer print check verification | Frank Chilese, Moshe E. Preil | 2020-09-15 |