Issued Patents 2020
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10636621 | Charged particle beam device for moving an aperture having plurality of openings and sample observation method | Akinari HANAWA, Hideki Kikuchi, Yoshifumi Taniguchi, Toshie Yaguchi, Takashi Dobashi +1 more | 2020-04-28 |
| 10535497 | Electron microscope and imaging method | Ken Harada, Keiji Tamura, Yoshifumi Taniguchi, Hiroto Kasai, Toshie Yaguchi +1 more | 2020-01-14 |