Issued Patents 2020
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10770264 | Interference optical system unit, charged particle beam interference apparatus, and method for observing charged particle beam interference image | Yoh Iwasaki, Keiko Shimada | 2020-09-08 |
| 10535497 | Electron microscope and imaging method | Hirokazu Tamaki, Keiji Tamura, Yoshifumi Taniguchi, Hiroto Kasai, Toshie Yaguchi +1 more | 2020-01-14 |