Issued Patents 2020
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10748272 | Measuring height difference in patterns on semiconductor wafers | Ishai Schwarzband, Yan Avniel, Sergey Khristo, Shimon Levi, Doron Girmonsky +1 more | 2020-08-18 |
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Mor Baram
Overall (2020): #339,126 of 565,922Top 60%
1
Patents 2020