Issued Patents 2020
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10748272 | Measuring height difference in patterns on semiconductor wafers | Ishai Schwarzband, Sergey Khristo, Mor Baram, Shimon Levi, Doron Girmonsky +1 more | 2020-08-18 |
| 10636140 | Technique for inspecting semiconductor wafers | Ishai Schwarzband, Sergey Khristo | 2020-04-28 |