Issued Patents 2020
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10748272 | Measuring height difference in patterns on semiconductor wafers | Ishai Schwarzband, Yan Avniel, Sergey Khristo, Mor Baram, Doron Girmonsky +1 more | 2020-08-18 |
| 10731979 | Method for monitoring nanometric structures | Ishai Schwarzband, Roman Kris | 2020-08-04 |