Issued Patents 2020
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10658062 | Simultaneous scan chain initialization with disparate latches | Benedikt Geukes, Krishnendu Mondal | 2020-05-19 |
| 10598526 | Methods and systems for performing test and calibration of integrated sensors | Preetham M. Lobo, Franco Motika, John D. Parker, Gerard M. Salem, Tobias Webel | 2020-03-24 |
| 10586606 | Simultaneous scan chain initialization with disparate latches | Benedikt Geukes, Krishnendu Mondal | 2020-03-10 |
| 10571519 | Performing system functional test on a chip having partial-good portions | Preetham M. Lobo, Franco Motika, John D. Parker, Gerard M. Salem | 2020-02-25 |