Issued Patents 2020
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10613142 | Non-destructive recirculation test support for integrated circuits | Mary P. Kusko, Franco Motika | 2020-04-07 |
| 10598526 | Methods and systems for performing test and calibration of integrated sensors | Mitesh Agrawal, Preetham M. Lobo, Franco Motika, John D. Parker, Tobias Webel | 2020-03-24 |
| 10585142 | Functional diagnostics based on dynamic selection of alternate clocking | Mary P. Kusko, Franco Motika | 2020-03-10 |
| 10571519 | Performing system functional test on a chip having partial-good portions | Mitesh Agrawal, Preetham M. Lobo, Franco Motika, John D. Parker | 2020-02-25 |
| 10545188 | Functional diagnostics based on dynamic selection of alternate clocking | Mary P. Kusko, Franco Motika | 2020-01-28 |