Issued Patents 2020
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10692584 | Built-in self-test (BIST) engine configured to store a per pattern based fail status in a pattern mask register | Aravindan J. Busi, John R. Goss, Paul J. Grzymkowski, Kiran K. Narayan, Michael R. Ouellette +1 more | 2020-06-23 |
| 10658062 | Simultaneous scan chain initialization with disparate latches | Mitesh Agrawal, Benedikt Geukes | 2020-05-19 |
| 10586606 | Simultaneous scan chain initialization with disparate latches | Mitesh Agrawal, Benedikt Geukes | 2020-03-10 |
| 10553302 | Built-in self-test (BIST) engine configured to store a per pattern based fail status in a pattern mask register | Aravindan J. Busi, John R. Goss, Paul J. Grzymkowski, Kiran K. Narayan, Michael R. Ouellette +1 more | 2020-02-04 |