Issued Patents 2020
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10777470 | Selective inclusion/exclusion of semiconductor chips in accelerated failure tests | Lin Lee Cheong, Tomonori Honda, Rohan D. Kekatpure, Lakshmikar Kuravi | 2020-09-15 |
| 10766119 | Spectra based endpointing for chemical mechanical polishing | Boguslaw A. Swedek, Dominic J. Benvegnu | 2020-09-08 |
| 10734293 | Process control techniques for semiconductor manufacturing processes | — | 2020-08-04 |
| 10651098 | Polishing with measurement prior to deposition of outer layer | Tomohiko Kitajima, Jun Qian, Taketo Sekine, Garlen C. Leung, Sidney P. Huey | 2020-05-12 |