Issued Patents 2020
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10777470 | Selective inclusion/exclusion of semiconductor chips in accelerated failure tests | Lin Lee Cheong, Rohan D. Kekatpure, Lakshmikar Kuravi, Jeffrey Drue David | 2020-09-15 |
| 10558766 | Method for Modelica-based system fault analysis at the design stage | Bhaskar Saha, Ion Matei, Daniel G. Bobrow, Johan Dekleer, William C. Janssen, Jr. +1 more | 2020-02-11 |