Issued Patents 2020
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10818000 | Iterative defect filtering process | Saar Shabtay, Amir Watchs | 2020-10-27 |
| 10803575 | System, method and computer program product for generating a training set for a classifier | Ohad Shaubi, Assaf Asbag | 2020-10-13 |
| 10748271 | Method of defect classification and system thereof | Assaf Asbag, Orly ZVITIA, Efrat Rosenman | 2020-08-18 |
| 10720367 | Process window analysis | Yotam Sofer | 2020-07-21 |
| 10663407 | Method of examining locations in a wafer with adjustable navigation accuracy and system thereof | Mark Geshel | 2020-05-26 |