Issued Patents 2020
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10679912 | Wafer scale testing and initialization of small die chips | Akihiro Horibe, Yasuteru Kohda, Seiji Munetoh, Kuniaki Sueoka | 2020-06-09 |
| 10657065 | Delayed write-back in memory | Thomas Andre, Syed M. Alam, Javed S. Barkatullah | 2020-05-19 |