Issued Patents 2020
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10679912 | Wafer scale testing and initialization of small die chips | Akihiro Horibe, Yasuteru Kohda, Chitra Subramanian, Kuniaki Sueoka | 2020-06-09 |
| 10560470 | Monitoring device monitoring network | — | 2020-02-11 |