Issued Patents 2020
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10790113 | Multi-beam charged particle imaging apparatus | Ali Mohammadi-Gheidari, Marek Un{hacek over (c)}ovský | 2020-09-29 |
| 10784076 | 3D defect characterization of crystalline samples in a scanning type electron microscope | Tomá{hacek over (s)} Vystav{hacek over (e)}l, Anna Prokhodtseva | 2020-09-22 |