Issued Patents 2020
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10846845 | Training an artificial neural network using simulated specimen images | Ond{hacek over (r)}ej Machek, Libor Strako{hacek over (s)}, Pavel Potocek | 2020-11-24 |
| 10784076 | 3D defect characterization of crystalline samples in a scanning type electron microscope | Bohuslav Sed'a, Anna Prokhodtseva | 2020-09-22 |