Issued Patents 2020
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10784076 | 3D defect characterization of crystalline samples in a scanning type electron microscope | Tomá{hacek over (s)} Vystav{hacek over (e)}l, Bohuslav Sed'a | 2020-09-22 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10784076 | 3D defect characterization of crystalline samples in a scanning type electron microscope | Tomá{hacek over (s)} Vystav{hacek over (e)}l, Bohuslav Sed'a | 2020-09-22 |