YS

Yasir Sulehria

IBM: 1 patents #5,490 of 11,274Top 50%
📍 Latham, NY: #16 of 33 inventorsTop 50%
🗺 New York: #4,995 of 13,306 inventorsTop 40%
Overall (2020): #217,321 of 565,922Top 40%
1
Patents 2020

Issued Patents 2020

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
10578981 Post-lithography defect inspection using an e-beam inspection tool Luciana Meli Thompson, Ekmini Anuja De Silva, Nelson Felix 2020-03-03