Issued Patents 2020
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10794952 | Product performance test binning | Jeanne P. Bickford, Theodoros E. Anemikos, Susan K. Lichtensteiger | 2020-10-06 |
| 10700013 | IC wafer for identification of circuit dies after dicing | Wen Liu, Sebastian T. Ventrone, Adam C. Smith, Janice M. Adams | 2020-06-30 |
| 10564214 | Optimization of integrated circuit reliability | Carole D. Graas, Deborah M. Massey, John G. Massey, Pascal A. Nsame, Ernest Y. Wu +1 more | 2020-02-18 |
| 10539611 | Integrated circuit chip reliability qualification using a sample-specific expected fail rate | Jeanne P. Bickford, Baozhen Li, Tad J. Wilder | 2020-01-21 |