Issued Patents 2020
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10793969 | Sample rod growth and resistivity measurement during single crystal silicon ingot production | Carissima Marie Hudson, JaeWoo Ryu, Richard J. Phillips, HyungMin Lee, YoungJung Lee | 2020-10-06 |
| 10796945 | High resistivity silicon-on-insulator substrate comprising a charge trapping layer formed by He—N2 co-implantation | Qingmin Liu | 2020-10-06 |
| 10781532 | Methods for determining the resistivity of a polycrystalline silicon melt | Carissima Marie Hudson, JaeWoo Ryu, Richard J. Phillips, HyungMin Lee, YoungJung Lee | 2020-09-22 |