Issued Patents 2020
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10793969 | Sample rod growth and resistivity measurement during single crystal silicon ingot production | JaeWoo Ryu, Richard J. Phillips, Robert W. Standley, HyungMin Lee, YoungJung Lee | 2020-10-06 |
| 10781532 | Methods for determining the resistivity of a polycrystalline silicon melt | JaeWoo Ryu, Richard J. Phillips, Robert W. Standley, HyungMin Lee, YoungJung Lee | 2020-09-22 |
| 10707093 | Method of treating silicon wafers to have intrinsic gettering and gate oxide integrity yield | Young Jung Lee, Jae Woo Ryu, Byung Chun Kim, Robert J. Falster, Soon Sung Park +2 more | 2020-07-07 |