Issued Patents 2020
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10846846 | Pattern inspection apparatus and pattern inspection method | Masataka Shiratsuchi, Riki Ogawa, Hideaki Hashimoto, Ryoichi Hirano, Hideo Tsuchiya +1 more | 2020-11-24 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10846846 | Pattern inspection apparatus and pattern inspection method | Masataka Shiratsuchi, Riki Ogawa, Hideaki Hashimoto, Ryoichi Hirano, Hideo Tsuchiya +1 more | 2020-11-24 |