Issued Patents 2020
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10627213 | Statistical hierarchical reconstruction from metrology data | Seyed Iman Mossavat, Hugo Augustinus Joseph Cramer | 2020-04-21 |
| 10592618 | Methods and apparatus for simulating interaction of radiation with structures, metrology methods and apparatus, device manufacturing method | Markus Gerardus Martinus Maria Van Kraaij, Maxim PISARENCO | 2020-03-17 |