Issued Patents 2020
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10860633 | Systems and methods for inferring a time zone of a node profile using electronic activities | Oleg Rogynskyy, Tetiana Lutsaievska, Wei Hai | 2020-12-08 |
| 10801978 | XPS metrology for process control in selective deposition | Charles Thomas Larson, Wei Ti Lee | 2020-10-13 |
| 10657130 | Systems and methods for generating a performance profile of a node profile including field-value pairs using electronic activities | Devin Rice, Adam Draper, Wei Hai, Jose Alberto Muniz Navarro, Oleg Rogynskyy | 2020-05-19 |
| 10545980 | Systems and methods for restricting generation and delivery of insights to second data source providers | Oleg Rogynskyy, David Flink, Wei Hai | 2020-01-28 |