Issued Patents 2019
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10473579 | Apparatus for inspecting material property of plurality of measurement objects | Tae-Heung Ahn, Young-Duk Kim, Sang Gil Park, Jun Bum Park, Yoichiro Iwa | 2019-11-12 |
| 10431505 | Method of inspecting surface having a minute pattern based on detecting light reflected from metal layer on the surface | Jun Bum Park, Kyung-Sik Kang, Jae Chol Joo, Tae-Joong Kim | 2019-10-01 |
| 10338370 | Clock signal generators and substrate inspecting apparatuses having the same | Jun Bum Park, Kyung-Sik Kang, Tae-Joong Kim, Sang Ok Seok | 2019-07-02 |