Issued Patents 2019
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10473579 | Apparatus for inspecting material property of plurality of measurement objects | Tae-Heung Ahn, Young-Duk Kim, Jun Bum Park, Yoichiro Iwa, Byeong Hwan Jeon | 2019-11-12 |