Issued Patents 2019
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10431505 | Method of inspecting surface having a minute pattern based on detecting light reflected from metal layer on the surface | Jun Bum Park, Kyung-Sik Kang, Byeong Hwan Jeon, Tae-Joong Kim | 2019-10-01 |