Issued Patents 2019
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10495668 | Evaluation apparatus for semiconductor device and evaluation method for semiconductor device | Akira Okada | 2019-12-03 |
| 10436833 | Evaluation apparatus and evaluation method | Akira Okada, Kinya YAMASHITA, Masaki Ueno | 2019-10-08 |
| 10359448 | Device and method for inspecting position of probe, and semiconductor evaluation apparatus | Akira Okada, Norihiro Takesako | 2019-07-23 |
| 10209273 | Probe position inspection apparatus, semiconductor device inspection apparatus and semiconductor device inspection method | Norihiro Takesako, Akira Okada | 2019-02-19 |
| 10168380 | Semiconductor device evaluation jig, semiconductor device evaluation apparatus, and semiconductor device evaluation method | Akira Okada, Koichi Mochizuki | 2019-01-01 |