Issued Patents 2019
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10359448 | Device and method for inspecting position of probe, and semiconductor evaluation apparatus | Akira Okada, Takaya Noguchi | 2019-07-23 |
| 10209273 | Probe position inspection apparatus, semiconductor device inspection apparatus and semiconductor device inspection method | Takaya Noguchi, Akira Okada | 2019-02-19 |