Issued Patents 2019
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10495668 | Evaluation apparatus for semiconductor device and evaluation method for semiconductor device | Takaya Noguchi | 2019-12-03 |
| 10436833 | Evaluation apparatus and evaluation method | Kinya YAMASHITA, Masaki Ueno, Takaya Noguchi | 2019-10-08 |
| 10359448 | Device and method for inspecting position of probe, and semiconductor evaluation apparatus | Takaya Noguchi, Norihiro Takesako | 2019-07-23 |
| 10228412 | Semiconductor device and method for testing same | Hajime Akiyama, Kinya YAMASHITA | 2019-03-12 |
| 10224388 | Wiring core structure, semiconductor evaluation device and semiconductor device | Masayoshi Hirao, Kazushige Matsuo | 2019-03-05 |
| 10209273 | Probe position inspection apparatus, semiconductor device inspection apparatus and semiconductor device inspection method | Norihiro Takesako, Takaya Noguchi | 2019-02-19 |
| 10192797 | Semiconductor device and electrical contact structure thereof | Hajime Akiyama, Kinya YAMASHITA | 2019-01-29 |
| 10168380 | Semiconductor device evaluation jig, semiconductor device evaluation apparatus, and semiconductor device evaluation method | Takaya Noguchi, Koichi Mochizuki | 2019-01-01 |