Issued Patents 2019
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10436833 | Evaluation apparatus and evaluation method | Akira Okada, Masaki Ueno, Takaya Noguchi | 2019-10-08 |
| 10228412 | Semiconductor device and method for testing same | Hajime Akiyama, Akira Okada | 2019-03-12 |
| 10192797 | Semiconductor device and electrical contact structure thereof | Hajime Akiyama, Akira Okada | 2019-01-29 |