Issued Patents 2019
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10504687 | Signal separator for a multi-beam charged particle inspection apparatus | Ron Naftali | 2019-12-10 |
| 10453645 | Method for inspecting a specimen and charged particle multi-beam device | Jürgen Frosien | 2019-10-22 |
| 10453649 | Apparatus and method for inspecting a sample using a plurality of charged particle beams | Aernout Christiaan Zonnevylle, Yan Ren | 2019-10-22 |
| 10395887 | Apparatus and method for inspecting a surface of a sample, using a multi-beam charged particle column | Ron Naftali | 2019-08-27 |
| 10312052 | Multi electron beam inspection apparatus | — | 2019-06-04 |