Issued Patents 2019
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10504687 | Signal separator for a multi-beam charged particle inspection apparatus | Pieter Kruit | 2019-12-10 |
| 10446434 | Chuck for supporting a wafer | Doron Korngut, Yuri Belenky, Yoram Uziel, Ron Bar-Or, Yuval Gronau | 2019-10-15 |
| 10421125 | Controlling an intensity profile of an energy beam in additive manufacturing based on travel direction or velocity | Hou T. Ng, Christopher G. Talbot | 2019-09-24 |
| 10395887 | Apparatus and method for inspecting a surface of a sample, using a multi-beam charged particle column | Pieter Kruit | 2019-08-27 |
| 10307822 | Controlling an intensity profile of an energy beam with a deformable mirror in additive manufacturing | Hou T. Ng, Christopher G. Talbot | 2019-06-04 |