Issued Patents 2019
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10453649 | Apparatus and method for inspecting a sample using a plurality of charged particle beams | Pieter Kruit, Yan Ren | 2019-10-22 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10453649 | Apparatus and method for inspecting a sample using a plurality of charged particle beams | Pieter Kruit, Yan Ren | 2019-10-22 |