Issued Patents 2019
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10203200 | Analyzing root causes of process variation in scatterometry metrology | Tal Marciano, Michael Adel, Mark Ghinovker, Barak Bringoltz, Dana Klein +2 more | 2019-02-12 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10203200 | Analyzing root causes of process variation in scatterometry metrology | Tal Marciano, Michael Adel, Mark Ghinovker, Barak Bringoltz, Dana Klein +2 more | 2019-02-12 |