Issued Patents 2019
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10408602 | Quality estimation and improvement of imaging metrology targets | Yuri Paskover | 2019-09-10 |
| 10366483 | Wafer notch detection | Nassim Bishara, Arkady Simkin, Yaron Ish-Shalom | 2019-07-30 |
| 10242290 | Method, system, and user interface for metrology target characterization | Inna Tarshish-Shapir, Yoel Feler, Anat Marchelli, Berta Dinu, Vladimir Levinski +4 more | 2019-03-26 |