Issued Patents 2019
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10509073 | Timing-aware test generation and fault simulation | Kun-Han Tsai, Mark Kassab, Chen Wang, Janusz Rajski | 2019-12-17 |
| 10372855 | Scan cell selection for partial scan designs | Ting-Pu Tai, Wu-Tung Cheng, Takeo Kobayashi | 2019-08-06 |
| 10222420 | Transition test generation for detecting cell internal defects | Wu-Tung Cheng, Janusz Rajski | 2019-03-05 |