Issued Patents 2019
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10522319 | Electron beam apparatus | Keigo Kasuya, Noriaki Arai, Toshiaki Kusunoki, Tomihiro Hashizume, Yusuke Sakai | 2019-12-31 |
| 10340117 | Ion beam device and sample observation method | Shinichi Matsubara, Hiroyasu Shichi | 2019-07-02 |
| 10241062 | Charged particle beam device, sample observation method, sample platform, observation system, and light emitting member | Yusuke Ominami, Mitsugu Sato, Kenko Uchida, Sadamitsu Aso, Taku Sakazume +2 more | 2019-03-26 |