Issued Patents 2019
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10366858 | Ion beam device | Shinichi Matsubara, Yoshimi Kawanami, Hiroyuki Muto | 2019-07-30 |
| 10361065 | Ion milling system | Kengo Asai, Toru Iwaya, Hisayuki Takasu | 2019-07-23 |
| 10340117 | Ion beam device and sample observation method | Shinichi Matsubara, Takashi Ohshima | 2019-07-02 |
| 10332722 | Ion milling device and ion milling method | Kengo Asai, Hisayuki Takasu, Toru Iwaya | 2019-06-25 |
| 10304657 | Mirror ion microscope and ion beam control method | Masaki Hasegawa, Teruo Kohashi, Shinichi Matsubara | 2019-05-28 |
| 10304653 | Ion milling device, ion source and ion milling method | Kengo Asai, Hisayuki Takasu, Toru Iwaya | 2019-05-28 |
| 10276341 | Control method and control program for focused ion beam device | Keiji Watanabe, Toshiyuki Mine, Masatoshi Morishita | 2019-04-30 |
| 10211022 | Ion beam apparatus and ion beam irradiation method | Shinichi Matsubara, Yoshimi Kawanami, Tomihiro Hashizume | 2019-02-19 |