Issued Patents 2019
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10395885 | Charged particle device, charged particle irradiation method, and analysis device | — | 2019-08-27 |
| 10304657 | Mirror ion microscope and ion beam control method | Hiroyasu Shichi, Masaki Hasegawa, Shinichi Matsubara | 2019-05-28 |
| 10210962 | Charged particle beam device, optical device, irradiation method, diffraction grating system, and diffraction grating | Ken Harada, Tomohiro Iwane | 2019-02-19 |