Issued Patents 2019
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10446659 | Negative capacitance integration through a gate contact | Steven Bentley, Puneet Harischandra Suvarna | 2019-10-15 |
| 10340146 | Reliability caps for high-k dielectric anneals | Shariq Siddiqui, Chung-Ju Yang | 2019-07-02 |
| 10332969 | Negative capacitance matching in gate electrode structures | Steven Bentley, Puneet Harischandra Suvarna, Zoran Krivokapic | 2019-06-25 |