Issued Patents 2019
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10497092 | Continuous light inspection | Menachem Regensburger, Zehava Ben-Ezer | 2019-12-03 |
| 10222517 | Aperture stop | Tomer Gilad | 2019-03-05 |
| 10215707 | System for inspecting a backside of a wafer | Zehava Ben Ezer, Guy Kafry, Eldad Langmans, Natan Deutsch | 2019-02-26 |