Issued Patents 2019
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10497092 | Continuous light inspection | Shimon Koren, Zehava Ben-Ezer | 2019-12-03 |
| 10203289 | Inspection system and a method for inspecting a diced wafer | Yuri Postolov | 2019-02-12 |
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10497092 | Continuous light inspection | Shimon Koren, Zehava Ben-Ezer | 2019-12-03 |
| 10203289 | Inspection system and a method for inspecting a diced wafer | Yuri Postolov | 2019-02-12 |