Issued Patents 2019
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10215707 | System for inspecting a backside of a wafer | Zehava Ben Ezer, Shimon Koren, Eldad Langmans, Natan Deutsch | 2019-02-26 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10215707 | System for inspecting a backside of a wafer | Zehava Ben Ezer, Shimon Koren, Eldad Langmans, Natan Deutsch | 2019-02-26 |