Issued Patents 2019
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10215707 | System for inspecting a backside of a wafer | Guy Kafry, Shimon Koren, Eldad Langmans, Natan Deutsch | 2019-02-26 |
| 10197505 | Method and system for low cost inspection | Ophir Peleg | 2019-02-05 |