Issued Patents 2019
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10444640 | Metrology apparatus, lithographic system, and method of measuring a structure | Janneke Ravensbergen, Duygu Akbulut, Nitesh Pandey | 2019-10-15 |
| 10310389 | Method of measuring, device manufacturing method, metrology apparatus, and lithographic system | Nitesh Pandey, Samee Ur Rehman, Martin Jacobus Johan Jak | 2019-06-04 |