Issued Patents 2018
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10157257 | Method for analyzing an electromigration (EM) rule violation in an integrated circuit | Wan-Yu Lo, Chung-Hsing Wang, Kuo-Nan Yang | 2018-12-18 |
| 10157258 | Method for evaluating failure-in-time | Ming-Hsien Lin, Kuo-Nan Yang, Chung-Hsing Wang | 2018-12-18 |
| 10042967 | Electromigration sign-off methodology | Yu-Tseng Hsien, Ching-Shun Yang, Jui-Feng Kuan | 2018-08-07 |