Issued Patents 2018
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10126251 | Inspection systems and techniques with enhanced detection | — | 2018-11-13 |
| 10082470 | Defect marking for semiconductor wafer inspection | David W. Shortt, Junwei Wei, Daniel L. Kapp, Charles Amsden | 2018-09-25 |