JW

Junwei Wei

KL Kla-Tencor: 1 patents #130 of 353Top 40%
📍 Milpitas, CA: #178 of 477 inventorsTop 40%
🗺 California: #23,431 of 60,411 inventorsTop 40%
Overall (2018): #353,216 of 503,207Top 75%
1
Patents 2018

Issued Patents 2018

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
10082470 Defect marking for semiconductor wafer inspection David W. Shortt, Steven R. Lange, Daniel L. Kapp, Charles Amsden 2018-09-25