Issued Patents 2018
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10082470 | Defect marking for semiconductor wafer inspection | David W. Shortt, Steven R. Lange, Junwei Wei, Charles Amsden | 2018-09-25 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10082470 | Defect marking for semiconductor wafer inspection | David W. Shortt, Steven R. Lange, Junwei Wei, Charles Amsden | 2018-09-25 |